XRD Bruker D8 Advance

The diffractometer is configured in reflection mode and in Bragg-Brentano geometry. It is optimised to collect XRD patterns with high intensity for accurate phase ID and quantification.

• Cu-Kα radiation operated at 40kV and 40mA      
• Vertical high precision goniometer
• 1D type detector: The LynxEye 1-dimensional detector is based on silicon strip detector technology capable of collecting at a high count rate. High quality data with high intensity can be collected in a short time
• Batch sample automatic loader
• Beam knife attachment for data collection with low background at low 2Theta angle

• X-ray diffraction analysis of crystalline materials for phase ID, quantification, micro-structure analysis and crystal structure refinement/determination