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TEM JEOL 2100F
FACTS ABN B4
Field-emission transmission electron microscopes
We have two JEOL 2100 field-emission transmission electron microscopes (TEMs) with similar features. They are capable of both TEM and STEM imaging and EDX for elemental composition analysis. One JEOL 2100 has a Gatan imaging filter for compositional analysis using EELS
contact: Andrew Wong (Dr) at [email protected]
In TEM mode the specimen is illuminated with a parallel beam of electrons. The transmitted electrons are magnified using magnetic lenses and imaged on a CCD camera. In STEM mode the electrons are focussed to a fine probe and scanned across the specimen. Signals such as the transmitted electrons or scattered electrons (HAADF) are recorded as the beam scans.
| 2100f-a Accelerating Voltage: 200KV Gun: ZrO/W(100) Schottky field-emission gun Point Resolution: 0.19 nm Line Resolution : 0.1 nm STEM Resolution: 0.19 nm Equipped with: JEOL bright-field and dark-field STEM detectors Oxford Ulti Max 100mm^2 (~0.7 sr) windowless detector Gatan Digiscan and STEM detector 2k × 2k Gatan Ultrascan 1000XP CCD Gatan 963 Quantum GIF SE for EELS and EFTEM JEOL double tilt holder JEOL Be double tilt holder |
2100f-b Accelerating Voltage: 200KV Gun: ZrO/W(100) Schottky field-emission gun Point Resolution: 0.19 nm Line Resolution : 0.1 nm STEM Resolution: 0.19 nm Equipped with: JEOL bright-field and dark-field STEM detectors JED EDX with 50mm^2 detector Gatan Digiscan and STEM detector 4k × 2.6k Gatan Orius SC1000 CCD Gatan 863 Tridiem GIF for EELS and EFTEM JEOL double tilt holder JEOL Be double tilt holder |
- High resolution imaging
- STEM
- EDX elemental analysis