/enri-thumbnails/careeropportunities1f0caf1c-a12d-479c-be7c-3c04e085c617.tmb-mega-menu.jpg?Culture=en&sfvrsn=d7261e3b_1)
/cradle-thumbnails/research-capabilities1516d0ba63aa44f0b4ee77a8c05263b2.tmb-mega-menu.jpg?Culture=en&sfvrsn=1bc94f8_1)
FESEM JEOL JSM-7800F PRIME
FACTS at N4.1 B4-10
FESEM for high resolution imaging, with capabilities for high-speed EDX and EBSD analysis
Capable of very fast EDX and EBSD data collection and analysis
FESEM system for high resolution imaging equipped with multiple detectors for additional capabilities
Resolution: 0.7 nm
Accelerating Voltage: 0.01 to 30 kV
Magnification: 10x to 1,000,000x
Electron source: Thermal FEG
X-ray analysis: Aztec – Ultim Max 170mm2
Other attachments: Symmetric EBSD detector, TED, low vacuum (LV) SED & BED
Accelerating Voltage: 0.01 to 30 kV
Magnification: 10x to 1,000,000x
Electron source: Thermal FEG
X-ray analysis: Aztec – Ultim Max 170mm2
Other attachments: Symmetric EBSD detector, TED, low vacuum (LV) SED & BED
- High-resolution imaging
- EBSD data collection and analysis
- EDX elemental composition analysis