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JEOL JEM 2200fs
FACTS @ ABN B4
A TEM that can be operated at 200kV and 120kV, and equipped with a Schottky field emission gun
Transmission electron microscopy
TEM analysis is carried out by allowing a beam of electrons through a thin (~100nm) slice of material. Electrons transmitted or scattered by the material can be used to form images and diffraction patterns.
Accelerating Voltage: 200KV, 120KV
Gun: ZrO/W(100) Schottky field-emission gun
Point Resolution: 0.27 nm
Line Resolution : 0.14 nm
Energy Resolution: 0.8 eV
Equipped with:
In-column energy filter
2k × 2k Gatan Ultrascan 894
JEOL high tilt holder for tomography
Jadas Single Particle Data Acquisition Software
Shot Meister software for drift correction
Recorder and Composer software for tomography
Gun: ZrO/W(100) Schottky field-emission gun
Point Resolution: 0.27 nm
Line Resolution : 0.14 nm
Energy Resolution: 0.8 eV
Equipped with:
In-column energy filter
2k × 2k Gatan Ultrascan 894
JEOL high tilt holder for tomography
Jadas Single Particle Data Acquisition Software
Shot Meister software for drift correction
Recorder and Composer software for tomography
High resolution TEM
Tomography
Energy filtered TEM
Tomography
Energy filtered TEM