Facility Usage Charges
Use of FACTS instruments is subject to the charges shown below.
Note that the standard rate covers only a small portion of the total cost of running, maintaining and training users on our state of the art equipment.
Notes:
- Charging applies to all research staff and students.
- Charges below do not include Goods and Services Tax (GST).
- Office hours refer to 8 am - 6 pm Monday to Friday, excluding public holidays.
- After office hour rates are 50% of Office hour rates.
- Undergraduates are allowed to operate the thermionic SEMs and XRD cluster 1.
- Undergraduates are only allowed to use XRD cluster 2 after approval.
- Samples should be submitted to the person in charge of the instrument for analysis. Charges will be incurred.
- Minimum 1 hour usage charge for SEM/XRD, 2 hours for TEM / FIB.
- For priority booking, a 100% extra charge will be imposed.
- For usage with assistance, the charges are for the technical operation of our instruments and do not include data analysis nor any guarantee of results.
- Charges will still apply if users cancel their booking within 24 hours or fail to turn up for their booked session. Please cancel sessions as soon as you know you are unable to use them to allow others to use the instrument.
- Non-NTU users can only use the instruments with technical assistance from our scientists and will be charged at the usage with assistance rate.
- For NTU users who require more information, please email us at [email protected], including full details of your samples.
- For non-NTU company/industry requests please email us at [email protected] for a quote.
* For single crystal XRD, each sample run is capped at 300 SGD/hr.
*** For FIB training, if user is not proficient enough to operate the FIB at the end of the training, extra day(s) of training will be required at the rate of 460SGD/day.
CAA 3rd Jan 2023
Usage Hourly Rates
NTU Standard rate (Self operation) | NTU (Usage With Assistance) | Other Academic Institution (Usage With Assistance) | |
TEM Cluster | | | |
TEM 2100F / TEM 2200FS | 70 | 268 | 402 |
TEM 2010 | 52 | 250 | 375 |
| | | |
Aberration-Corrected TEM Cluster | | | |
ACTEM JEOL ARM200F/ARM300F | 120 | 428 | 642 |
| | | |
Focused Ion Beam | | | |
Zeiss Crossbeam 540 FIB*** | 80 | 219 | 328 |
| | | |
Field-Emission SEM Cluster | | | |
FESEM 7800F PRIME with LV and EBSD | 46 | 178 | 267 |
FESEM 7600F | 40 | 172 | 258 |
FESEM 6340F | 30 | 162 | 243 |
E-beam lithography system | 12 | - | - |
Thermo Scientific Quattro S with EDAX WDS/EDS | 55 | 187 | 281 |
| | | |
Thermionic SEM Cluster | | | |
Thermionic-SEM 6360/5500LV/5410 | 20 | 152 | 228 |
| | | |
XRD Cluster 1 | | | |
XRD Shimadzu Powder / XRD Shimadzu Thin Film | 20 | 130 | 195 |
| | | |
XRD Cluster 2 | | | |
XRD Bruker D8 Advance | 22 | 132 | 198 |
| | | |
XRD Cluster 3 | | | |
Bruker D8 Discover HR-XRD | 25 | 157 | 236 |
Bruker SMART APEX II SC-XRD* | 30 | 162 | 243 |
Rigaku SMARTLab 9 kW XRD | 50 | 182 | 273 |
| | | |
Small-Wide Angle X-ray Scattering | | | |
SWAXS Anton-Paar SAXSess | 15 | 147 | 221 |
SWAXS Xenocs Nano-inXider | 40 | 172 | 258 |
Microanalysis / Surface techniques | | | |
EPMA JEOL JXA-8530F | 30 | 201 | 301 |
XPS Kratos AXIS Supra | 90 | 170 | 391 |
Scanning Auger AES JAMP-7830F | 60 | 231 | 346 |
XRF S8 Tiger | 60 | 231 | 346 |
| | | |
Specimen Preparation Cluster (no assistance) | | | |
PIPS | 6 | | |
Ultramicrotome | 10 | | |
Cryo-ultramicrotome | 20 | | |
Disc cutter & grinder | 3 | | |
Dimpler | 3 | | |
Cryoplunge | 30 | | |
| | | |
Training | | | |
TEM 2100F | | 460 | |
TEM 2010 | | 460 | |
ACTEM ARM300F/ARM200F | | 2,700 | |
Cryo-TEM training | | 460 | /day |
FE-SEM cluster (including FESEM 6340F and FESEM 7600F/7800F) | | 400 | |
FE-SEM 7800F EBSD Training | | 100 | |
Thermionic SEM cluster | | 250 | |
XRD cluster 1 | | 60 | |
XRD cluster 2 | | 230 | |
XRD cluster 3 | | 300 | |
E-beam lithography training (on FESEM 7600F) | | 120 | |
Specimen Prep Training (PIPS, Dimpler, Disc Cutter & Grinder) | | 120 | |
Specimen Prep Training (Ultramicrotome) | | 250 | |
Specimen Prep Training (Cryoplunger) | | 200 | |
FIB training | | 1,000 | / training*** |
XPS Training | | 1,380 | / training |
XRF Training | | 400 | |