Facility Usage Charges

Use of FACTS instruments is subject to the charges shown below.
Note that the standard rate covers only a small portion of the total cost of running, maintaining and training users on our state of the art equipment.

Notes:

  1. Charging applies to all research staff and students.
  2. Charges below do not include Goods and Services Tax (GST).
  3. Office hours refer to 8 am - 6 pm Monday to Friday, excluding public holidays.
  4. After office hour rates are 50% of Office hour rates.
  5. Undergraduates are allowed to operate the thermionic SEMs and XRD cluster 1.
  6. Undergraduates are only allowed to use XRD cluster 2 after approval.
  7. Samples should be submitted to the person in charge of the instrument for analysis. Charges will be incurred.
  8. Minimum 1 hour usage charge for SEM/XRD, 2 hours for TEM / FIB.
  9. For priority booking, a 100% extra charge will be imposed.
  10. For usage with assistance, the charges are for the technical operation of our instruments and do not include data analysis nor any guarantee of results.
  11. Charges will still apply if users cancel their booking within 24 hours or fail to turn up for their booked session. Please cancel sessions as soon as you know you are unable to use them to allow others to use the instrument.
  12. Non-NTU users can only use the instruments with technical assistance from our scientists and will be charged at the usage with assistance rate.
  13. For NTU users who require more information, please email us at [email protected], including full details of your samples.
  14. For non-NTU company/industry requests please email us at [email protected] for a quote.

* For single crystal XRD, each sample run is capped at 300 SGD/hr.
*** For FIB training, if user is not proficient enough to operate the FIB at the end of the training, extra day(s) of training will be required at the rate of 460SGD/day.

 

CAA 3rd Jan 2023


Usage Hourly Rates

 NTU
Standard rate
(Self operation)
NTU

(Usage With Assistance)
Other Academic Institution
(Usage With Assistance)​
TEM Cluster
​TEM 2100F / TEM 2200FS70268402
​TEM 201052250375

Aberration-Corrected TEM Cluster
​ACTEM ​JEOL ARM200F/ARM300F
120
428642

Focused Ion Beam
​Zeiss Crossbeam 540 FIB***
​80
219328

Field-Emission SEM Cluster
​FESEM 7800F PRIME with LV and EBSD
​46
178267
​FESEM 7600F
40
172
258
FESEM 6340F
30
162​243​
​E-beam lithography system
​12
-
​-
​Thermo Scientific Quattro S with EDAX WDS/EDS
​55
187281

Thermionic SEM Cluster
Thermionic-SEM 6360/5500LV/5410
20152228

XRD Cluster 1
XRD ​Shimadzu Powder
/​ XRD ​Shimadzu Thin Film
20130​195
​XRD Cluster 2

XRD ​Bruker D8 Advance
/ XRD ​Bruker D2 Phaser

22132198
XRD Cluster 3
Bruker D8 Discover HR-XRD25157​236​
Bruker SMART APEX II SC-XRD*​30
162
243
​Rigaku SMARTLab 9 kW XRD
50182273
Small-Wide Angle X-ray Scattering

SWAXS Anton-Paar SAXSess
15
147
221
SWAXS ​Xenocs Nano-inXider40​172
​258




Microanalysis / Surface techniques

​EPMA JEOL JXA-8530F
30​201
​301
​XPS Kratos AXIS Supra
90​170
391
Scanning ​Auger AES JAMP-7830F
60231346
​XRF S8 Tiger
60​231
346

   

Specimen Preparation Cluster
(no assistance)
​PIPS6​
​Ultramicrotome​10
​Cryo-ultramicrotome​20
​Disc cutter & grinder​3
​Dimpler​3
​Cryoplunge​30
​Training
​TEM 2100F
​460
​TEM 2010
​460
​ACTEM ARM300F/ARM200F
​2,700

​Cryo-TEM training
460​/day​
​FE-SEM cluster
(including FESEM 6340F and FESEM 7600F/7800F)

400​
​FE-SEM 7800F EBSD Training
​100
Thermionic ​SEM cluster
​250
​XRD cluster 1
60
​XRD cluster 2​230
​XRD cluster 3
​300
​E-beam lithography training
(on FESEM 7600F)

​120
​Specimen Prep Training (PIPS, Dimpler, Disc Cutter & Grinder)​120
​Specimen Prep Training (Ultramicrotome)250
​Specimen Prep Training (Cryoplunger)
200
FIB training​
1,000​/ training***​
​XPS Training

​1,380
​/ training
​XRF Training

​400