X-ray diffraction from polycrystalline materials, in the form of powder, bulk and thin films can be carried out to identify the phases present in the material. Further analysis allows the crystallinity, amorphous content, phase quantification and structure determination to be determined and refined.
Epitaxial thin films are single crystalline material grown on a substrate. The epitaxial relationship between the film and the substrate in terms of orientation relationship, mosaicity and strain are some of the information that can be extracted from high-resolution XRD analysis.

Small angle X-ray scattering (SAXS) is a technique used to investigate the structure of particle systems in order to quantify the size distribution and shape of the particles. This method involves x-ray scattering at very low angles (0-10° in 2q) capturing particle sizes in the range of 1-100 nm. X-ray scattering at wider angles can also be collected at >10° in 2q capturing smaller dimensions of <1nm. This corresponds to wide angle X-ray scattering (WAXS) and it probes the crystalline structure of the particle. The WAXS data carries the same information as the data collected using normal XRD analysis.

The SAXS-WAXS technique can also be applied in reflection mode and this is commonly called as Grazing Incidence (GI) SAXS-WAXS. GISAXS/GIWAXS is use to characterise the structural assembly of nanoparticles and crystals on a surface.

SAXS is applied to a broad range of materials, including colloids of all types of metals, cement, oil, polymers, proteins, foods and pharmaceuticals found in academic research and quality control in industry.

facts_SAXS_size-analysis
facts_GISAXS

XRD Bruker D8 Advance

Oct 26, 2020, 19:31 PM
A dedicated X-ray diffractometer for the structural analysis of polycrystalline samples
Title : XRD Bruker D8 Advance
Book now URL :
Location : FACTS N4.1 B4-10
The diffractometer is configured in reflection mode and in Bragg-Brentano geometry. It is optimised to collect XRD patterns with high intensity for accurate phase ID and quantification.
Powder, thin film and bulk samples.
  • Cu-Kα radiation operated at 40kV and 40mA      
  • Vertical high precision goniometer
  • 1D type detector: The LynxEye 1-dimensional detector is based on silicon strip detector technology capable of collecting at a high count rate. High quality data with high intensity can be collected in a short time
  • Batch sample automatic loader
  • Beam knife attachment for data collection with low background at low 2Theta angle
  • X-ray diffraction analysis of crystalline materials for phase ID, quantification, micro-structure analysis and crystal structure refinement/determination
Category : Characterization - physical sciences, materials
Process : Diffraction
Instrument/Equipment :
bruker d8 advance
Related services
Related people
Thin films and coatings are typically processed via spin-coating, chemical vapour deposition and physical vapour deposition on a solid substrate. The resulting film can be characterised using X-ray reflectivity to determine it's thickness, density and roughness.
Crystalline materials when processed to form certain shapes (foils, plates, coatings, wires) will exhibit a preferred orientation. This gives rise to anisotropy in the materials properties and will significantly affect its performance and functionality. Preferred orientation can be analysed by collecting pole figures using XRD.
X-ray sources are typically generated at high-power and for most sealed tubes the maximum rating is about 2kW. This limitation means that the amount of X-ray photons hitting your sample are limited. For dynamic studies, samples in small quantities and weakly scattering materials, the go-to solution is using synchrotron radiation. However synchrotron radiation is not locally available and may not be easily accessible. For this reason laboratory source utilising the rotating anode X-ray source are a good alternative. They can have powers up to 9.5kW producing high flux X-rays suitable for dynamic studies (e-cell, heating, humidity) and weakly scattering samples.

XRF machines are used to determine bulk elemental composition in a non-destructive way.

With detection limits down to ppm and the ability to analyse from Boron to Uranium, XRF offers an alternative to smaller volume, destructive elemental analysis like ICP-MS or EPMA.

Some of our X-ray instruments come with different stages that allow for in-situ X-ray scattering experiments.

If you have some in-situ or in-operando experiments that requires a DIY or a different set-up we are more than happy to discuss the possibilities. What we care most is the quality of data you can collect consistent with the safe operation of the instrument.

Anton Paar DHS 1100 heating stage

Heating range: RT to 1100 °C

Used in Bruker D8 Discover

 

facts-htxrd--stage-2

Linkam heating-cooling stage

range: -150°C to 350°C

transmission samples: powder, liquid or gel

reflection samples: thin film, plate

used in Xenocs Nanoinxider for SAXS/WAXS and GISAXS/GIWAXS

Electrochemical cell

for use in Rigaku Smartlab