XRD Shimadzu XRD-6000
- Cu-Kα radiation operated at 40 kV and 30 mA
- Detector: 0D type, Scintillation counter (Scintillator: NaI)
- Kβ radiation is removed by a graphite monochromator located on the diffracted side
- HV/PHA: High voltage power supply 500 to 1200V
- High speed and high precision vertical goniometer
- Powder XRD: theta-2theta scan mode
- Thin film XRD: 2theta scan mode (fixed theta)
- X-ray diffraction analysis of crystalline materials for phase ID, quantification, micro-structure analysis and crystal structure refinement/determination
Small angle X-ray scattering (SAXS) is a technique used to investigate the structure of particle systems in order to quantify the size distribution and shape of the particles. This method involves x-ray scattering at very low angles (0-10° in 2q) capturing particle sizes in the range of 1-100 nm. X-ray scattering at wider angles can also be collected at >10° in 2q capturing smaller dimensions of <1nm. This corresponds to wide angle X-ray scattering (WAXS) and it probes the crystalline structure of the particle. The WAXS data carries the same information as the data collected using normal XRD analysis.
The SAXS-WAXS technique can also be applied in reflection mode and this is commonly called as Grazing Incidence (GI) SAXS-WAXS. GISAXS/GIWAXS is use to characterise the structural assembly of nanoparticles and crystals on a surface.
SAXS is applied to a broad range of materials, including colloids of all types of metals, cement, oil, polymers, proteins, foods and pharmaceuticals found in academic research and quality control in industry.
XRD Shimadzu XRD-6000
- Cu-Kα radiation operated at 40 kV and 30 mA
- Detector: 0D type, Scintillation counter (Scintillator: NaI)
- Kβ radiation is removed by a graphite monochromator located on the diffracted side
- HV/PHA: High voltage power supply 500 to 1200V
- High speed and high precision vertical goniometer
- Powder XRD: theta-2theta scan mode
- Thin film XRD: 2theta scan mode (fixed theta)
- X-ray diffraction analysis of crystalline materials for phase ID, quantification, micro-structure analysis and crystal structure refinement/determination
XRF machines are used to determine bulk elemental composition in a non-destructive way.
With detection limits down to ppm and the ability to analyse from Boron to Uranium, XRF offers an alternative to smaller volume, destructive elemental analysis like ICP-MS or EPMA.
Some of our X-ray instruments come with different stages that allow for in-situ X-ray scattering experiments.
If you have some in-situ or in-operando experiments that requires a DIY or a different set-up we are more than happy to discuss the possibilities. What we care most is the quality of data you can collect consistent with the safe operation of the instrument.
Anton Paar DHS 1100 heating stage
Heating range: RT to 1100 °C
Used in Bruker D8 Discover
Linkam heating-cooling stage
range: -150°C to 350°C
transmission samples: powder, liquid or gel
reflection samples: thin film, plate
used in Xenocs Nanoinxider for SAXS/WAXS and GISAXS/GIWAXS
Electrochemical cell
for use in Rigaku Smartlab