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Research Facilities & Equipment
MBE
Cypher Scanning Probe Microscope
Video Contact Angle
SEM
DTG
FT-IR
200mm Wafer Probe Station and Electrical Measurement Setup
Ultra-High Vacuum Conductive Atomic Force Microscope
| Laboratories | Location | Telephone |
| Characterization | S1-B2c-20/21 | 6790 5479/5477 |
| Device Fabrication Simulation Laboratory | S2-B5a-01 | 6790 6407/6393 |
| Nanoelectronics I | S1-B3a-01 | 6790 5454 |
| Nanoelectronics II | S1-B4a-01 | 6790 5454 |
| Nanomaterials Laboratory | S21-B5-01 | 6790 4548 |
| Semiconductor Characterization Laboratory | S1-B3c-27a |
Contact Information
To know more about the centre facilities/laboratories, please contact our Research Centre's Cluster Manager:
Mr Chan Kar Sing
Email: [email protected]
Tel: 6790 5477