Thrust (i) - Data Recovery via Advanced Failure Analysis Techniques

In this thrust, the research focus is on data recovery for damaged storage devices. Depending on the extent of damage on storage devices, different techniques and tools can be used to recover the data.

In cases where the device does not function properly anymore and yet the data inside the memory chips is still intact, this is known as physical damage. Chip off could be the solution to repair and restore the device’s functionality. With the advances in microelectronics fabrication and packaging technology, the data stored in the cells have become more sensitive to external factors. Thus, the feasibility of applying chip off approach with physical failure analysis techniques on advanced storage devices (e.g., USB storage devices and cell phones) shall be investigated in this project.

Some damaged storage devices are beyond repair by chip off technique. Micro read technique is theoretically capable to detect the logical states of a memory cell inside microchips. The feasibility of different micro read techniques will be explored in this study.

• Investigation of device level physical failure analysis and chip off techniques for readable data extraction from advanced memory devices;
• Exploration of readable data extraction techniques for damaged non-volatile memory devices.